Argelsrieder Feld 14
82234 Wessling
Germany
P +49 8153 405-0
F +49 8153 405-33
www.laser2000.de
82234 Wessling
Germany
P +49 8153 405-0
F +49 8153 405-33
www.laser2000.de
Продукты и услуги
- 1.1.1 YAG lasers
- 1.1.2 Other YAG Laser
- 1.1.5 Nd: YVO lasers
- 1.1.6 Raman lasers
- 1.1.7 Titanium sapphire lasers
- 1.1.9 Alexandrite lasers
- 1.1.10 Diode-pumped solid-state lasers
- 1.1.11 Solid-state lasers, other
- 1.2.1 He Lasers
- 1.2.2 Ar Laser
- 1.2.4 CO₂ lasers
- 1.2.5 Excimer lasers
- 1.2.6 Gas lasers, other
- 1.3.1 Discrete laser diodes
- 1.3.2 High-power diode lasers
- 1.3.3 Diode laser modules
- 1.3.4 Diode laser systems
- 1.3.5 Tunable diode lasers
- 1.3.6 Pulsed diode lasers
- 1.4.1 Erbium fibre lasers
- 1.4.2 Ytterbium fibre lasers
- 1.4.3 Neodym fibre lasers
- 1.4.4 Pulsed fibre lasers
- 1.4.5 High power fibre lasers
- 1.5.2 Optical parametric oscillators
- 1.5.5 Ultrashort-pulse laser
- 1.5.6 Thz lasers
- 1.6.1 Beam guidance systems
- 1.6.2 Beam distribution and extensions
- 1.6.3 Beam amplifiers
- 1.6.4 Beam controlling
- 1.7.1 Flash lamps
- 1.7.2 Krypton lamps
- 1.7.4 Glasses
- 1.7.5 Crystals
- 1.7.6 Pumps
- 1.7.7 Mirrors
- 1.7.8 Optical pumping equipment
- 1.7.9 Laser accessories
- 1.8.1 Laser safety filters
- 1.8.2 Laser safety and laser alignment eyewear
- 1.8.3 Laser safety gloves and clothing
- 1.8.4 Laser safety shields/screens and curtains
- 1.8.5 Laser safety enclosures and cabins
- 1.8.6 Active laser safety systems
- 1.8.7 Laser safety products and components, other
- 1.8.8 Laser safety consulting, certification and training
- 1.9 Light-emitting diodes (LEDs) and components
- 1.10 OLEDs
- 1.11 Non-coherent light and radiation sources
- 1.12.1 Optical amplifiers
- 1.12.2 Optical Q switches
- 1.12.3 Modulators
- 1.12.4 Kerr and pockels cells
- 1.12.5 Driver electronics
- 1.12.6 Beam deflection systems
- 1.12.7 Galvano-mirror systems
- 1.12.8 Electro-optical equipment, other
- 1.13.1 Acousto-optical deflectors
- 1.13.2 Acousto-optical filters
- 1.13.3 Acousto-optical modulators
- 1.13.4 HF drivers for acousto-optical components
- 1.13.5 Acousto-optical components, other
- 1.13.6 Acousto-optical Bragg cells
- 1.13.7 Acousto-optical products, other
- 1.15.1 Image sensors and detector arrays
- 1.15.2 Photodiodes
- 1.15.3 Photocells
- 1.15.6 IR components
- 1.15.7 IR optics
- 1.15.9 Thermopiles and radiometers
- 1.15.10 Photomultipliers
- 1.15.11 Optical choppers
- 1.15.12 Opto-electronic components, other
- 1.16.1 Beam expanders
- 1.16.3 Optical isolators
- 1.16.4 Objectives
- 1.16.6 Optical systems, other
- 1.17.1 Diaphragms
- 1.17.2 Optical mounts
- 1.17.3 Fixtures
- 1.17.4 Optical benches
- 1.17.5 Optical tables
- 1.17.6 Positioners
- 1.17.7 Laser-beam positioning systems
- 1.17.8 Polarization optics
- 1.17.9 Optical mechanics, other
- 1.18.1 Simulation software for optical components
- 1.18.2 Simulation software for opto electrical components
- 1.18.3 Simulation software for light sources
- 1.18.4 Laser software
- 1.18.5 Software for laser und optics, other
- 1.19 Placement and assembly systems
- 2.1.1 Raw materials, glass
- 2.1.2 Raw materials, crystal glass
- 2.1.3 Raw materials, quartz glass
- 2.1.4 Raw materials, synthetics
- 2.1.5 Glass ceramics
- 2.1.6 Optical foils
- 2.1.7 Raw materials, other
- 2.2.1 Non-linear crystals
- 2.2.2 Electro-optical crystals
- 2.2.3 Piezo-electric crystals
- 2.2.4 Frequency doubler crystals
- 2.3.1 Linear plates
- 2.3.2 Polarizers
- 2.3.3 Optical prisms
- 2.3.4 Optical mirrors
- 2.3.5 Beam splitters
- 2.3.6 Interference filters
- 2.3.7 Optical filters
- 2.3.8 Micro-optical components
- 2.3.9 Optical windows
- 2.3.10 Wedges
- 2.3.11 Processed components, other
- 2.4.1 Spherical lenses
- 2.4.2 Aspherical lenses
- 2.4.3 Cylindrical lenses
- 2.4.5 Complexes/multiple element lens assemblies
- 2.5.1.1 Transmission gratings
- 2.5.1.2 Reflection gratings
- 2.5.1.3 Blaze gratings
- 2.5.1.4 Wire gratings
- 2.5.2 Fresnel lenses
- 2.6.1 Optical fibers
- 2.6.2 Integrated optics
- 2.6.3 Passive components for signal conditioning
- 2.6.4 Fiber couplers
- 2.6.5 Optical signal transmission systems, other
- 2.7.1 Cassegrain optics
- 2.7.2 Domes
- 2.7.3 Windows
- 2.7.4 Other optical components
- 2.8 Design software for passive optical components
- 2.9 Systems for cleaning and maintenance of optics
- 4.1.1 Laser beam analysis systems
- 4.1.2 Energy density
- 4.1.3 Beam profiles
- 4.1.4 M2 quality
- 4.1.5 Wavelength
- 4.1.6 Wavefront
- 4.1.7 Power
- 4.1.8 Pulse duration/shape
- 4.1.9 Laser diode test and characterization systems (power, current, voltage, spectrum)
- 4.2.1 IR measurement engineering, IR measurement technology
- 4.2.2 Monochromators
- 4.2.3 Optical spectrum analyzers
- 4.2.4 Optical multi-channel analyzers
- 4.2.5 Polarization analyzers
- 4.2.6 Spectral photometers
- 4.2.7 Spectrometers
- 4.2.8 Spectroradiometers
- 4.2.9 Beam scatter meters
- 4.2.10 Stress birefringence
- 4.2.11 Photon counters
- 4.2.12 Opto-electronic measuring and analysis systems, other
- 4.3.2 Interferometers
- 4.3.3 Spherometers
- 4.3.4 Collimators
- 4.3.5 Auto collimators
- 4.3.6 Focometers
- 4.3.7 Alignment measurement devices
- 4.3.8 Prism measurement devices
- 4.3.9 Optical test systems
- 4.4.1 Microscopes
- 4.4.2 Telescopes
- 4.4.3 Test systems for optical components
- 4.4.4 Environmental measurement and analysis systems
- 4.5.1.1 Spacing, distance
- 4.5.1.2 Presence
- 4.5.1.3 Shape, contour
- 4.5.1.4 Level
- 4.5.1.5 Length, travel
- 4.5.1.6 Roughness
- 4.5.1.7 Position
- 4.5.1.8 Layer thickness
- 4.5.1.9 Angle, tilt, orientation
- 4.5.1.10 Sensors for geometric parameters, other
- 4.5.2.1 Flow
- 4.5.2.2 Speed
- 4.5.2.3 Acceleration
- 4.5.2.4 Elongation
- 4.5.2.5 Oscillation, vibration
- 4.5.2.6 Sensors for dynamic parameters, other
- 4.5.3.1 Absorption, opaqueness, transmission
- 4.5.3.2 Color, color values
- 4.5.3.3 Refraction
- 4.5.3.4 Reflection, diffuse reflection/scatter, shine
- 4.5.3.5 Optical power
- 4.5.3.6 UVA/UVB/UVC radiation, radiation dose
- 4.5.3.7 IR/NIR radiation, radiation dose
- 4.5.3.8 Radiance, irradiance
- 4.5.3.9 Luminance, illuminance
- 4.5.3.10 Wavefront sensors
- 4.5.3.11 Sensors for optical parameters, other
- 4.5.4.1 Humidity
- 4.5.4.2 Temperature
- 4.5.4.3 Gas, exhaust-gas analysis
- 4.5.4.4 Application-specific sensors, other
- 5.2 Optical design and engineering services
- 5.7 Optics and illumination design
- 5.9 Education and advanced training
- 5.14 Customer-specific solutions
- 6.1 Systems for the automotive industry and OEMs
- 6.2 Systems for the toolmaking and mechanical engineering
- 6.3 Systems for printing technology and graphics
- 6.4 Systems for data processing and information technology
- 6.5 Systems for electronics
- 6.6 Systems for electrical engineering
- 6.7 Systems for the semiconductor industry
- 6.8 Systems for plastics processing
- 6.9 Systems for biophotonics, life sciences and pharma
- 6.10 Systems for research and science
- 6.11 Systems for show technology, advertising, art
- 6.12 Systems for sensor technology
- 6.13 Systems for illumination technology
- 6.14 Systems for solar production
- 6.16 Systems for aerospace industry
- 6.17 Systems for security engineering
- 6.18 Systems for imaging and machine vision
- 6.19 Systems for production of energy storage
- 6.20 Systems for others sectors
- 7.1.1 Welding systems
- 7.1.1.1 Robot based welding systems
- 7.1.1.2 Portal welding system
- 7.1.1.3 Remote welding systems
- 7.1.1.4 Hybrid welding systems
- 7.1.1.5 Welding systems, other
- 7.1.3.1 Robot based cutting systems
- 7.1.3.2 Portal cutting systems
- 7.1.3.3 Remote cutting systems
- 7.1.3.4 Cutting systems, other
- 7.1.4 Drilling systems
- 7.1.5 Scribing systems
- 7.1.6 Marking and lettering systems
- 7.1.7 Trimming systems
- 7.1.8 Surface processing systems
- 7.1.9 Micro processing systems
- 7.1.10 Laser build-up welding
- 7.1.11 Material processing systems, other
- 7.2.1 High-precision drives
- 7.2.2 Handling equipment
- 7.2.4 Monitoring and recognition systems
- 7.2.6 Fiber systems
- 7.2.10 Laser working heads and adapters
- 7.4.1 Systems for metall processing
- 7.4.2 Systems for the processing of synthetic materials
- 7.4.4 Systems for the processing of textile materials
- 7.4.5 Systems for processing of transparent materials / glass
- 7.4.6 Systems for the processing of other materials or combinations of materials (metal/plastics/carbon fibre/ceramics)
- 7.5.1 Laser systems for joining processes
- 7.5.2 Laser systems for ablation processes
- 7.5.3 Laser systems for forming processes
- 7.5.4 Laser systems for disjoining processes
- 7.5.5 Laser systems for drilling processes
- 7.5.6 Laser systems for modifying material properties
- 7.5.7 Laser systems for marking
- 7.5.9 Laser systems, other
- 7.6.1 Direct structuring with lasers
- 7.6.2 Laser-based coating processes
- 7.6.3 Laser based layer conditioning
- 8.1.1 Movement and positioning measurement instruments
- 8.1.2 Distance and thickness measurement instruments
- 8.1.3 Interferometers
- 8.1.4 Contour measuring
- 8.1.5 Light barriers
- 8.1.6 Lidar systems
- 8.1.7 Particle measuring instruments
- 8.1.8 Scanners
- 8.1.9 Systems for geodesy and construction
- 8.1.10 Systems for surface inspection
- 8.1.11 Systems for production and quality control
- 8.1.12 Systems for security and monitoring
- 8.1.15 Laser-induced breakdown spectroscopy LIBS
- 8.1.17 Holographic test and measurement technology
- 8.1.19 Film thickness measurement
- 8.1.20 Vibrational analysis
- 8.1.21 Laser test and measurement systems, other
- 8.2.1 Holographic systems
- 9.1.2 Fiber optic cables
- 9.1.3 Cabling systems
- 9.1.4 Terminated cabling systems
- 9.1.5 Plastic optical fiber and cabling
- 9.1.6 Industrial cabling systems
- 9.1.7 Pigtails and patchcords
- 9.1.8 Singlemode connectors
- 9.1.9 Multimode connectors
- 9.1.10 Connector termination shops
- 9.1.11 Polisher
- 9.1.12 Fiber microscopes and interferometer
- 9.2.1 Light sources
- 9.2.2 Optical amplifiers
- 9.2.3 Optical transmitter, receiver & transceiver
- 9.2.4 Active optical components and subsystems, other
- 9.3.1 Photodetectors
- 9.3.2 Passive optical components
- 9.3.3 Optical switches
- 9.3.4 Optical de-/multiplexer
- 9.3.5 Passive optical components and subsystems, other
- 9.4.1 Level meters
- 9.4.2 Transmission, reflexion meters
- 9.4.3 Optical spectrum analyzers
- 9.4.4 Component analyzers (active, passive)
- 9.4.5 Polarisation analyzer
- 9.4.6 Chromatic dispersion analyzers
- 9.4.7 Polarimeters
- 9.4.8 OTDRs
- 9.4.9 Optical spektrum analyzers
- 9.4.10 Dispersion analyzers
- 9.4.11 Protokoll analyzers
- 9.4.12 Test and measurement, other
- 9.5.1 Processing equipment for fiber optics
- 9.5.3 Equipment for assembly and packging
- 10.2.1.1 Fluorescence spectroscopy
- 10.2.1.2 Photoluminescence
- 10.2.1.3 Terahertz spectroscopy
- 10.2.1.4 ATR/FTIR spectroscopy
- 10.2.1.5 UV/VIS spectroscopy
- 10.2.1.6 Raman spectroscopy
- 10.2.1.7 Ellipsometry
- 10.2.1.8 LIDAR
- 10.2.1.10 Other spectroscopy techniques
- 10.2.2.2 Linear and non-linear vibration microscopy/imaging (IR, confocal Raman, CARS, etc.)
- 10.2.2.3 Terahertz imaging
- 10.2.2.5 Near-field microskopy (SNOM, ASM, STM, etc.)
- 10.2.2.7 OCT Optical Coherence Tomography
- 10.2.2.8 Endoscopy
- 10.2.2.10 Microscopy and imaging techniques, other
- 11.1.1 Matrix cameras
- 11.1.2 CCD line-scan cameras
- 11.1.3 IR cameras
- 11.1.4 Intensified cameras
- 11.1.5 High-speed cameras
- 11.1.6 Thermal image cameras
- 11.1.7 Special cameras for science and industry
- 11.1.8 CCD and CMOS sensors and cameras
- 11.1.9 Cameras, other
- 11.1.10 Objectives
- 11.1.11 Frame grabber
- 11.1.12 IR image converters
- 11.1.13 Streak cameras and analysis systems
- 11.1.14 Image processors and computer components
- 11.1.15 Fiber optical illumination
- 11.1.16 LED illumination
- 11.2.1 Measurement
- 11.2.2 Measurement and comparison 2D
- 11.2.3 Measurement and comparison 3D
- 11.2.4 Recognition
- 11.2.5 Pattern-recognition systems
- 11.2.6 Position recognition systems
- 11.2.7 Inspection
- 11.2.8 Surface inspection systems and texture analysis
- 11.2.9 Completeness check
- 11.2.10 Color check
- 11.2.11 Quality control
- 11.2.12 Identification
- 11.2.13 Barcodes
- 11.2.14 2D barcodes
- 11.2.15 Identification systems
- 11.2.16 Security systems
- 11.3.1 Software for image processing and feature detection
- 11.3.2 Image scanning and analysis systems
- 11.3.3 Image processing systems
- 11.3.4 Industrial image processing, other
- 12.1.1 Light-emitting diodes (LEDs) and components
- 12.1.4 New lamp systems for general illumination
- 13.2.1 Camera modules
- 13.2.4 High power lasers
- 13.2.5 Image intensifier optics
- 13.2.6 IR-laser
- 13.2.7 IR-objectives for TWS
Применение
- Data Processing and Information Technology
- Imaging and machine vision
- Materials Processing
- Sensor Technology