Polytec GmbH

Продукты и услуги

• 1.1.10 Diode-pumped solid-state lasers
• 1.2.1 He Lasers
• 1.2.2 Ar Laser
• 1.3.3 Diode laser modules
• 1.3.4 Diode laser systems
• 1.12.2 Optical Q switches
• 1.12.3 Modulators
• 1.12.4 Kerr and pockels cells
• 1.12.5 Driver electronics
• 1.12.8 Electro-optical equipment, other
• 1.13.3 Acousto-optical modulators
• 1.13.4 HF drivers for acousto-optical components
• 1.13.5 Acousto-optical components, other
• 1.13.6 Acousto-optical Bragg cells
• 1.13.7 Acousto-optical products, other
• 1.15.1 Image sensors and detector arrays
• 1.15.11 Optical choppers
• 1.16.3 Optical isolators
• 4.1.7 Power
• 4.2.1 IR measurement engineering, IR measurement technology
• 4.2.3 Optical spectrum analyzers
• 4.2.7 Spectrometers
• 4.2.8 Spectroradiometers
• 4.2.12 Opto-electronic measuring and analysis systems, other
• 4.3.1 MTF measurement systems
• 4.3.2 Interferometers
• 4.3.4 Collimators
• 4.3.9 Optical test systems
• 4.4.3 Test systems for optical components
• 4.5.1.1 Spacing, distance
• 4.5.1.3 Shape, contour
• 4.5.1.5 Length, travel
• 4.5.1.6 Roughness
• 4.5.1.7 Position
• 4.5.1.8 Layer thickness
• 4.5.1.9 Angle, tilt, orientation
• 4.5.1.10 Sensors for geometric parameters, other
• 4.5.2.2 Speed
• 4.5.2.3 Acceleration
• 4.5.2.4 Elongation
• 4.5.2.5 Oscillation, vibration
• 4.5.3.3 Refraction
• 4.5.3.4 Reflection, diffuse reflection/scatter, shine
• 4.5.3.5 Optical power
• 4.5.3.6 UVA/UVB/UVC radiation, radiation dose
• 4.5.3.7 IR/NIR radiation, radiation dose
• 4.5.3.8 Radiance, irradiance
• 4.5.3.9 Luminance, illuminance
• 4.5.4.2 Temperature
• 5.17 Subcontracting measurement
• 5.19 Services, other
• 6.1 Systems for the automotive industry and OEMs
• 6.2 Systems for the toolmaking and mechanical engineering
• 6.5 Systems for electronics
• 6.6 Systems for electrical engineering
• 6.7 Systems for the semiconductor industry
• 6.10 Systems for research and science
• 6.12 Systems for sensor technology
• 6.16 Systems for aerospace industry
• 8.1.1 Movement and positioning measurement instruments
• 8.1.3 Interferometers
• 8.1.10 Systems for surface inspection
• 8.1.11 Systems for production and quality control
• 8.1.13 Velocimeter systems
• 8.1.14 Vibrometers
• 8.1.17 Holographic test and measurement technology
• 8.1.19 Film thickness measurement
• 8.1.20 Vibrational analysis
• 8.1.21 Laser test and measurement systems, other
• 8.1.22 Systems for temperature measurement
• 9.2.1 Light sources
• 9.2.3 Optical transmitter, receiver & transceiver
• 9.4.3 Optical spectrum analyzers
• 9.4.8 OTDRs
• 9.4.9 Optical spektrum analyzers
• 9.4.12 Test and measurement, other
• 11.1.1 Matrix cameras
• 11.1.3 IR cameras
• 11.1.5 High-speed cameras
• 11.1.10 Objectives
• 11.1.15 Fiber optical illumination
• 11.1.16 LED illumination
• 11.1.17 Accessories
• 11.2.1 Measurement
• 11.2.2 Measurement and comparison 2D
• 11.2.3 Measurement and comparison 3D
• 11.2.4 Recognition
• 11.2.5 Pattern-recognition systems
• 11.2.6 Position recognition systems
• 11.2.7 Inspection
• 11.2.8 Surface inspection systems and texture analysis
• 11.2.9 Completeness check
• 11.2.10 Color check
• 11.2.11 Quality control
• 11.2.12 Identification
• 11.2.13 Barcodes
• 11.2.14 2D barcodes
• 11.2.15 Identification systems
• 11.3.1 Software for image processing and feature detection
• 11.3.4 Industrial image processing, other
• 11.4.6 Display technology, other
• 13.3.12 Stabilized platform modules